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{
  "uri": "at://did:plc:zwzdlsvtvlxnpuacwhmqmd22/app.bsky.feed.post/3lksxbfzohs2k",
  "cid": "bafyreify7lnfalm6yfxkdqmccfzcfktyayscterqoz7gkxy6ugwwiwl5tm",
  "value": {
    "text": "Traditional prompt optimization is clearly missing a structured, scientific approach that will ensure reliability.\nFunctional testing leverages automated input-output testing with multiple iterations and algorithmic scoring to turn prompt engineering into a measurable, data-driven process. #AI #ML",
    "$type": "app.bsky.feed.post",
    "embed": {
      "$type": "app.bsky.embed.external",
      "external": {
        "uri": "https://towardsdatascience.com/mastering-prompt-engineering-with-functional-testing-a-systematic-guide-to-reliable-llm-outputs/",
        "thumb": {
          "$type": "blob",
          "ref": {
            "$link": "bafkreidn6zcerlkozipk6hjdcipb5gffrwdyjhu3di3q5rwjcogekqgsru"
          },
          "mimeType": "image/jpeg",
          "size": 319231
        },
        "title": "Mastering Prompt Engineering with Functional Testing: A Systematic Guide to Reliable LLM Outputs  | Towards Data Science",
        "description": "How prompt evaluation with a systematic approach composed of algorithmic testing with input/output data fixtures can make prompt engineering for complex AI tasks more reliable."
      }
    },
    "langs": [
      "en"
    ],
    "facets": [
      {
        "index": {
          "byteEnd": 294,
          "byteStart": 291
        },
        "features": [
          {
            "tag": "AI",
            "$type": "app.bsky.richtext.facet#tag"
          }
        ]
      },
      {
        "index": {
          "byteEnd": 298,
          "byteStart": 295
        },
        "features": [
          {
            "tag": "ML",
            "$type": "app.bsky.richtext.facet#tag"
          }
        ]
      }
    ],
    "createdAt": "2025-03-20T14:53:58.084Z"
  }
}